| MIST-X Multiple Ion Simulation Technology Introduction
- Ion exchange continues to gain popularity as the method of choice in
removing trace contaminants from ground water and other effluents that
must be treated prior to discharge. Generally speaking these are fairly
new and rapidly growing applications.
The number of substances
on the EPAs Maximum Contaminants List (MCL) continues to grow. The MCL
levels and purity requirements in all applications are becoming more
stringent as our ability to measure lower concentrations of all
substances and correlate them with health and production benefits
improves. When trace contaminants are to be removed, it is not unusual
to have two or more trace contaminants present that are simultaneously
removed in a single resin bed. Before Simulation Technology, there was
very little resin performance data available for these kinds of
applications.
For some trace ions, the service run lengths of an
ion exchange resin are enormous. In these cases it is more practical to
change out the exhausted resins for virgin resins instead of
regenerating them. However, in cases where multiple trace contaminants
are removed by a single resin bed, the thruput for each contaminant is
likely different than for the other(s). In these cases, the resin must
either regenerated or changed out when leakage of the first contaminant
reaches its limiting value. In other cases a contaminant that is
present but at levels below discharge limits could be concentrated by
the ion exchange resin and then released at excessive concentrations
later in the exhaustion cycle.
ResinTech's MIST-X Simulation
Technology combines mass action & kinetic relationships to simulate
exhaustion and regeneration cycles of most types ion exchange resin.
ResinTech’s Simulation program is designed to deal directly with
ionized substances removed by ion exchange resins. It calculates the
exhaustion profile for each ion in each portion of the water and the
resin bed as the water (or liquid) passes through the resin. Variations
in operating conditions can be studied quickly and efficiently. MIST-X
provides a (calculated) effluent history for every ionic substance
passing through the resin bed. The results are generally displayed
graphically but can also be presented in tabular format. There is
virtually no limit to the amount of ions, valences or number of
exhaustion and regeneration cycles that can be studied.
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